Instrument

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Instrument


	Electron Microscope `JEM-1400 Transmission Electron Microscope (穿透式電子顯微鏡)` `JEM-2100F Transmission Electron Microscope (場發射低溫穿透式電子顯微鏡)` `Tabletop Scanning Electron Microscope (桌上型掃描式電子顯微鏡)` `Low/Variable Vacuum Scanning Electron Microscope (低/可變真空掃描式電子顯微鏡)` `Scanning Electron Microscope (掃瞄電子顯微鏡)`


	Mass Spectrometer `HR-ICP-MS, Thermo-Fisher, Element 2 (高解析感應耦合電漿質譜儀)` `MC-ICP-MS, Thermo-Fisher, Neptune (多接收器感應耦合電漿質譜儀)` `TIMS, Thermo-Fisher, Triton TI (熱游離質譜儀)` `API 4000Q-Trap LC-MS/MS (串聯式液相層析質譜)` `LC-Mass/Mass (液相層析串聯質譜儀)` `nanoACQUITY UPLC system (極致效能液相層析分析系統)` `LTQ Orbitrap XL, Thermo-Fisher (二維線性離子阱式傅立葉轉換電場軌道多次質譜系統)`


	Biomedical and Non-Destructive Analysis `Laser Scanning Confocal Microscope (雷射共軛焦掃描顯微鏡暨數位影像系統)` `LSM780 Confocal (掃描式雷射共軛焦顯微影像系統)` `Non Invasion In Vivo Imaging System (非侵入式活體分子影像系統)` `Living Cell Time Lapse Observation System(Cell^R, Olympus)(活細胞多頻譜螢光影像及分析系統)` `BIAcore 3000 (生物分子交互作用分析系統)`


	X-ray `Micro Computed Tomography (超高解析度活動體動物斷層掃描儀)` `Single-Crystal X-Ray Diffractometer (單晶X-光繞射儀)` `D2 Phaser System (粉末X-光繞射儀)` `Electron Paramagnetic Resonance Spectrometer (電子順磁共振光譜儀)`


	Engineering Sample Preparation `PLD / Laser-MBE System (超高真空二維移動遮罩式雷射分子束磊晶鍍膜系統)` `Rapid Thermal Annealing System (高真空紅外線超快速加熱及退火系統))` `Core Facility for Novel Epitaxial Oxides, Nitrides and Metal Thin Films (磊晶氮氧化物及金屬材料成長核心設施)` `Connex 350 (RP快速原型機 3D Printing system)` `Mounting Press (自動鑲埋成型機)` `Polisher Machine (自動研磨拋光機)`


	Electrical Verification `Hall Effect Analyzer (霍爾效應分析儀)`


	Low Temperature and High Magnetic Field System `Physical Property Measurement System 09T (物理性質量測系統儀器)` `Physical Property Measurement System 14T (物理性質量測系統儀器)`


	Others `The Minispec Contrast Agent Analyzer (脈衝式氫核核磁共振儀)`

Electron Microscope (電子顯微鏡)

Mass Spectrometer (質譜儀)

Biomedical and Non-Destructive Analysis (生醫暨非破壞性分析)

X-ray

Engineering Sample Preparation (工程樣品製備)

Electrical Verification (電特性檢測)

Low Temperature and High Magnetic Field System (低溫高磁場設備)

Others(其他)